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Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices

dc.contributor.authorMaconi, Alessandro
dc.contributor.authorArreghini, Antonio
dc.contributor.authorMonzio Compagnoni, Christian
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorSpinelli, Alessandro S.
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorLacaita, Andrea L.
dc.date.accessioned2021-10-20T13:03:10Z
dc.date.available2021-10-20T13:03:10Z
dc.date.issued2012
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21072
dc.sourceIIOimport
dc.titleComprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices
dc.typeJournal article
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewyes
dc.source.beginpage64
dc.source.endpage70
dc.source.journalSolid-State Electronics
dc.source.volume74
imec.availabilityPublished - imec
imec.internalnotesselected papers ESSDERC 2011


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