dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.author | Chi, Chun-Chuan | |
dc.contributor.author | Konijnenburg, Mario | |
dc.contributor.author | Verbree, Jouke | |
dc.date.accessioned | 2021-10-20T13:15:04Z | |
dc.date.available | 2021-10-20T13:15:04Z | |
dc.date.issued | 2012-02 | |
dc.identifier.issn | 0923-8174 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21104 | |
dc.source | IIOimport | |
dc.title | A DfT architecture for 3D-SICs based on a standardizable die wrapper | |
dc.type | Journal article | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.imecauthor | Konijnenburg, Mario | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.contributor.orcidimec | Konijnenburg, Mario::0000-0001-8016-0888 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 73 | |
dc.source.endpage | 92 | |
dc.source.journal | Journal of Electronic Testing - Theory and Applications | |
dc.source.issue | 1 | |
dc.source.volume | 28 | |
dc.identifier.url | http://dx.doi.org/10.1007/s10836-011-5269-9 | |
imec.availability | Published - imec | |