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Interconnect test for wide-IO memory-on-logic stacks

dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorDeutsch, Sergej
dc.contributor.authorKeller, Brion
dc.contributor.authorChickermane, Vivek
dc.contributor.authorMukherjee, Subhashish
dc.contributor.authorSood, Navdeep
dc.date.accessioned2021-10-20T13:15:29Z
dc.date.available2021-10-20T13:15:29Z
dc.date.issued2012-07
dc.identifier.issn1363-5182
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21105
dc.sourceIIOimport
dc.titleInterconnect test for wide-IO memory-on-logic stacks
dc.typeJournal article
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewno
dc.source.beginpage112
dc.source.endpage117
dc.source.journalFuture Fab International
dc.source.issue42
dc.identifier.urlhttp://www.future-fab.com/documents.asp?d_ID=4965
imec.availabilityPublished - imec


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