Interconnect test for wide-IO memory-on-logic stacks

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Authors

Marinissen, Erik Jan; Deutsch, Sergej; Keller, Brion; Chickermane, Vivek; Mukherjee, Subhashish; Sood, Navdeep

ISSN

1363-5182

Issue

42

Journal

Future Fab International

Title

Interconnect test for wide-IO memory-on-logic stacks

Publication type

Journal article

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