Publication:

Interconnect test for wide-IO memory-on-logic stacks

Date

2012-07

Journal article

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Author(s)

Marinissen, Erik Jan

;

Deutsch, Sergej

;

;

Chickermane, Vivek

;

Mukherjee, Subhashish

;

Journal

Future Fab International

Statistics

1940 since deposited on 2021-10-20

Acq. date: 2026-05-02