Interconnect test for wide-IO memory-on-logic stacks

Publication:

2012-07

Journal article

Author(s)

;

Deutsch, Sergej

;

Keller, Brion

;

Chickermane, Vivek

;

Mukherjee, Subhashish

;

Sood, Navdeep

Future Fab International

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Acq. date: 2026-03-16