Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Interconnect test for wide-IO memory-on-logic stacks
Publication:
Interconnect test for wide-IO memory-on-logic stacks
Date
2012-07
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Deutsch, Sergej
;
Keller, Brion
;
Chickermane, Vivek
;
Mukherjee, Subhashish
;
Sood, Navdeep
Journal
Future Fab International
Abstract
Description
Metrics
Views
1933
since deposited on 2021-10-20
Acq. date: 2025-10-24
Citations
Metrics
Views
1933
since deposited on 2021-10-20
Acq. date: 2025-10-24
Citations