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Guest editorial: Special issue on testing of 3D stacked integrated circuits
Publication:
Guest editorial: Special issue on testing of 3D stacked integrated circuits
Date
2012-02
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Zorian, Yervant
Journal
Journal of Electronic Testing
Abstract
Description
Metrics
Views
1944
since deposited on 2021-10-20
Acq. date: 2025-10-29
Citations
Metrics
Views
1944
since deposited on 2021-10-20
Acq. date: 2025-10-29
Citations