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Device scaling model for bulk FinFETs

dc.contributor.authorMedury, Aditya
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorDe Keersgieter, An
dc.contributor.authorChiarella, Thomas
dc.contributor.authorCollaert, Nadine
dc.contributor.authorBhat, N
dc.contributor.authorBhat, KN
dc.date.accessioned2021-10-20T13:24:00Z
dc.date.available2021-10-20T13:24:00Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21127
dc.sourceIIOimport
dc.titleDevice scaling model for bulk FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorDe Keersgieter, An
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecDe Keersgieter, An::0000-0002-5527-8582
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage113
dc.source.endpage116
dc.source.conference13th International Conference on Ultimate Integration on Silicon - ULIS
dc.source.conferencedate6/03/2012
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - open access


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