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Electrical characterization of ALD Al2O3 – HfO2 and PECVD Al2O3 passivation layers for p-type CZ-Silicon PERC solar cells
Publication:
Electrical characterization of ALD Al2O3 – HfO2 and PECVD Al2O3 passivation layers for p-type CZ-Silicon PERC solar cells
Date
2012
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Morato, Alessandro
;
Vermang, Bart
;
Goverde, Hans
;
Cornagliotti, Emanuele
;
Meneghesso, Gaudenzio
;
John, Joachim
;
Poortmans, Jef
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1900
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1900
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations