Radiation damage of Si1-xGex S/D p-MOSFETs with different Ge concentrations

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Authors

Nakashima, T.; Idemoto, T.; Tsunoda, I.; Takakura, K.; Yoneoka, M.; Ohyama, H.; Yoshino, K.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor

ISSN

0040-6090

Journal

Thin Solid Films

Volume

520

Title

Radiation damage of Si1-xGex S/D p-MOSFETs with different Ge concentrations

Publication type

Journal article

Embargo date

9999-12-31

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