Publication:
Correlation between interface traps and paramagnetic defects in c-Si/a-Si:H heterojunctions
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1878 since deposited on 2021-10-20
3last month
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Acq. date: 2026-08-26
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Statistics
Views
1878 since deposited on 2021-10-20
3last month
2last week
Acq. date: 2026-08-26
Citations