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Temperature activation of UTBOX SOI device characteristics with different source/drain engineering

dc.contributor.authorNicoletti, T.
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorVeloso, Anabela
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMartino, J.A.
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-20T13:52:48Z
dc.date.available2021-10-20T13:52:48Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21199
dc.sourceIIOimport
dc.titleTemperature activation of UTBOX SOI device characteristics with different source/drain engineering
dc.typeProceedings paper
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage61
dc.source.endpage62
dc.source.conference8th European Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI
dc.source.conferencedate24/01/2012
dc.source.conferencelocationMontpellier France
imec.availabilityPublished - open access


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