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Gate length impact on UTBOX FBRAM devices

dc.contributor.authorNicoletti, T.
dc.contributor.authorSantos, S.D.
dc.contributor.authorMartino, J.A.
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorVeloso, Anabela
dc.contributor.authorJurczak, Gosia
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-20T13:53:37Z
dc.date.available2021-10-20T13:53:37Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21201
dc.sourceIIOimport
dc.titleGate length impact on UTBOX FBRAM devices
dc.typeProceedings paper
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage4.3
dc.source.conferenceIEEE International SOI Conference
dc.source.conferencedate1/10/2012
dc.source.conferencelocationNapa, CA USA
imec.availabilityPublished - open access


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