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Scaleable non-linear and bias-dependent low-frequency noise model for improved InP HEMT based MMIC oscillator design

dc.contributor.authorSchreurs, Dominique
dc.contributor.authorvan Meer, Hans
dc.contributor.authorvan der Zanden, Koen
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorNauwelaers, Bart
dc.date.accessioned2021-09-30T09:29:37Z
dc.date.available2021-09-30T09:29:37Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2123
dc.sourceIIOimport
dc.titleScaleable non-linear and bias-dependent low-frequency noise model for improved InP HEMT based MMIC oscillator design
dc.typeProceedings paper
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorDe Raedt, Walter
dc.contributor.imecauthorNauwelaers, Bart
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage187
dc.source.endpage192
dc.source.conference5th International Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications - EDMO
dc.source.conferencedate25/11/1997
dc.source.conferencelocationLondon UK
imec.availabilityPublished - open access


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