Show simple item record

Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability

dc.contributor.authorPadovani, Andrea
dc.contributor.authorArreghini, Antonio
dc.contributor.authorVandelli, Luca
dc.contributor.authorLarcher, Luca
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-20T14:11:03Z
dc.date.available2021-10-20T14:11:03Z
dc.date.issued2012
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21245
dc.sourceIIOimport
dc.titleEvidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability
dc.typeJournal article
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage53505
dc.source.journalApplied Physics Letters
dc.source.issue5
dc.source.volume101
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
24393.pdf
Size:
1.103Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record