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Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability
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Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Padovani, Andrea
;
Arreghini, Antonio
;
Vandelli, Luca
;
Larcher, Luca
;
Van den Bosch, Geert
;
Van Houdt, Jan
Journal
Applied Physics Letters
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1924
since deposited on 2021-10-20
Acq. date: 2025-12-10
Citations
Metrics
Views
1924
since deposited on 2021-10-20
Acq. date: 2025-12-10
Citations