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Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETs

dc.contributor.authorPavanello, Marcelo Antonio
dc.contributor.authorde Souza, Michelly
dc.contributor.authorMartino, Joao Martino
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-20T14:20:09Z
dc.date.available2021-10-20T14:20:09Z
dc.date.issued2012
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21267
dc.sourceIIOimport
dc.titleAnalysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETs
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage39
dc.source.endpage43
dc.source.journalSolid-State Electronics
dc.source.issue1
dc.source.volume70
imec.availabilityPublished - imec


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