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Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETs
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Authors
Pavanello, Marcelo Antonio
;
de Souza, Michelly
;
Martino, Joao Martino
;
Simoen, Eddy
;
Claeys, Cor
ISSN
0038-1101
Issue
1
Journal
Solid-State Electronics
Volume
70
Title
Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETs
Publication type
Journal article
Embargo date
9999-12-31
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