Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETs

dc.contributor.author	Pavanello, Marcelo Antonio
dc.contributor.author	de Souza, Michelly
dc.contributor.author	Martino, Joao Martino
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-20T14:20:09Z
dc.date.available	2021-10-20T14:20:09Z
dc.date.embargo	9999-12-31
dc.date.issued	2012
dc.identifier.issn	0038-1101
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/21267
dc.source.beginpage	39
dc.source.endpage	43
dc.source.issue	1
dc.source.journal	Solid-State Electronics
dc.source.volume	70
dc.title	Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETs
dc.type	Journal article
dspace.entity.type	Publication
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