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Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETs
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Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETs
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pavanello, Marcelo Antonio
;
de Souza, Michelly
;
Martino, Joao Martino
;
Simoen, Eddy
;
Claeys, Cor
Journal
Solid-State Electronics
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1857
since deposited on 2021-10-20
Acq. date: 2025-12-11
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1
since deposited on 2021-10-20
Acq. date: 2025-12-11
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1857
since deposited on 2021-10-20
Acq. date: 2025-12-11
Citations