Accurate de-embedding of the contribution of the test boards to the high-frequency characteristics of backplane connectors
dc.contributor.author | Sercu, Stefaan | |
dc.contributor.author | Martens, Luc | |
dc.date.accessioned | 2021-09-30T09:30:37Z | |
dc.date.available | 2021-09-30T09:30:37Z | |
dc.date.issued | 1997 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2129 | |
dc.source | IIOimport | |
dc.title | Accurate de-embedding of the contribution of the test boards to the high-frequency characteristics of backplane connectors | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Martens, Luc | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 177 | |
dc.source.endpage | 180 | |
dc.source.conference | IEEE 6th Topical Meeting on Electrical Performance of Electronic Packaging | |
dc.source.conferencedate | 27/10/1997 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - open access |