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Modeling challenges in nanoelectronics: an atomistic point of view

dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorClima, Sergiu
dc.contributor.authorSankaran, Kiroubanand
dc.contributor.authorHoussa, Michel
dc.contributor.authorEyben, Pierre
dc.contributor.authorSioncke, Sonja
dc.contributor.authorMagnus, Wim
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-20T14:47:08Z
dc.date.available2021-10-20T14:47:08Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21330
dc.sourceIIOimport
dc.titleModeling challenges in nanoelectronics: an atomistic point of view
dc.typeMeeting abstract
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorSankaran, Kiroubanand
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorMagnus, Wim
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecSankaran, Kiroubanand::0000-0001-6988-7269
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceConference on Computational Physics - CCP
dc.source.conferencedate14/10/2012
dc.source.conferencelocationKobe Japan
imec.availabilityPublished - open access


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