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dc.contributor.authorRamachandran, Vidhya
dc.contributor.authorTorregiani, Cristina
dc.contributor.authorDong Wook, Kim
dc.contributor.authorGu, Sam
dc.contributor.authorNowak, Matt
dc.contributor.authorDiBattista, Michael
dc.contributor.authorBabak, Motamedi
dc.contributor.authorCivale, Yann
dc.contributor.authorRedolfi, Augusto
dc.contributor.authorBeyne, Eric
dc.contributor.authorCroes, Kristof
dc.contributor.authorLi, Yunlong
dc.contributor.authorRouth, Bryan
dc.contributor.authorRue, Chad
dc.date.accessioned2021-10-20T15:05:28Z
dc.date.available2021-10-20T15:05:28Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21374
dc.sourceIIOimport
dc.titleAdvanced physical analysis of 3D interconnect
dc.typeOral presentation
dc.contributor.imecauthorRedolfi, Augusto
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorLi, Yunlong
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecLi, Yunlong::0000-0003-4791-4013
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conference29th Annual Advanced Metallization Conference - AMC
dc.source.conferencedate9/10/2012
dc.source.conferencelocationAlbany, NY USA
imec.availabilityPublished - open access


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