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Factors determining the damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, C.
dc.contributor.authorOhyama, Hidenori
dc.contributor.authorTakami, Y.
dc.contributor.authorSunaga, H.
dc.date.accessioned2021-09-30T09:31:59Z
dc.date.available2021-09-30T09:31:59Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2138
dc.sourceIIOimport
dc.titleFactors determining the damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conferenceAPSORC '97; OCtober 6-9 , 1997; Kunamoto, Japan.
dc.source.conferencelocation
imec.availabilityPublished - imec


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