dc.contributor.author | Ritzenthaler, Romain | |
dc.contributor.author | Schram, Tom | |
dc.contributor.author | Bury, Erik | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Ragnarsson, Lars-Ake | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Thean, Aaron | |
dc.contributor.author | Spessot, Alessio | |
dc.contributor.author | Caillat, Christian | |
dc.contributor.author | Srividya, Vidya | |
dc.contributor.author | Fazan, Pierre | |
dc.date.accessioned | 2021-10-20T15:15:22Z | |
dc.date.available | 2021-10-20T15:15:22Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21396 | |
dc.source | IIOimport | |
dc.title | Low-power DRAM-compatible replacement gate high-k/metal gate stacks | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Ritzenthaler, Romain | |
dc.contributor.imecauthor | Schram, Tom | |
dc.contributor.imecauthor | Bury, Erik | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Ragnarsson, Lars-Ake | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.imecauthor | Spessot, Alessio | |
dc.contributor.imecauthor | Fazan, Pierre | |
dc.contributor.orcidimec | Ritzenthaler, Romain::0000-0002-8615-3272 | |
dc.contributor.orcidimec | Schram, Tom::0000-0003-1533-7055 | |
dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Ragnarsson, Lars-Ake::0000-0003-1057-8140 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 242 | |
dc.source.endpage | 245 | |
dc.source.conference | 42nd European Solid-State Device Research Conference - ESSDERC | |
dc.source.conferencedate | 17/09/2012 | |
dc.source.conferencelocation | Bordeaux France | |
imec.availability | Published - open access | |