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Impact of technological aspects, radiation and low-temperature operation on the low-frequency noise behaviour of silicon-on-insulator MOSFETs

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-30T09:32:26Z
dc.date.available2021-09-30T09:32:26Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2141
dc.sourceIIOimport
dc.titleImpact of technological aspects, radiation and low-temperature operation on the low-frequency noise behaviour of silicon-on-insulator MOSFETs
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage31
dc.source.endpage43
dc.source.journalRevue HF / HF Magazine
dc.source.issue4
imec.availabilityPublished - open access


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