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Impact of technological aspects, radiation and low-temperature operation on the low-frequency noise behaviour of silicon-on-insulator MOSFETs
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Authors
Simoen, Eddy
;
Claeys, Cor
Issue
4
Journal
Revue HF / HF Magazine
Title
Impact of technological aspects, radiation and low-temperature operation on the low-frequency noise behaviour of silicon-on-insulator MOSFETs
Publication type
Journal article
Embargo date
9999-12-31
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