Publication:
Impact of technological aspects, radiation and low-temperature operation on the low-frequency noise behaviour of silicon-on-insulator MOSFETs
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1767 since deposited on 2021-09-30
1last month
Acq. date: 2025-12-15
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Views
1767 since deposited on 2021-09-30
1last month
Acq. date: 2025-12-15
Citations