Publication:

Impact of technological aspects, radiation and low-temperature operation on the low-frequency noise behaviour of silicon-on-insulator MOSFETs

Date

1997
Journal article
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-09-30T09:32:26Z
dc.date.available2021-09-30T09:32:26Z
dc.date.embargo9999-12-31
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2141
dc.source.beginpage31
dc.source.endpage43
dc.source.issue4
dc.source.journalRevue HF / HF Magazine
dc.title

Impact of technological aspects, radiation and low-temperature operation on the low-frequency noise behaviour of silicon-on-insulator MOSFETs

dc.typeJournal article
dspace.entity.typePublication
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