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Integrated spectrometer and integrated detectors on silicon-on-insulator for short-wave infrared applications

dc.contributor.authorRyckeboer, Eva
dc.contributor.authorGassenq, Alban
dc.contributor.authorHattasan, Nannicha
dc.contributor.authorKuyken, Bart
dc.contributor.authorCerutti, L.
dc.contributor.authorRodriguez, J.B.
dc.contributor.authorTournie, E.
dc.contributor.authorRoelkens, Gunther
dc.contributor.authorBogaerts, Wim
dc.contributor.authorBaets, Roel
dc.date.accessioned2021-10-20T15:34:50Z
dc.date.available2021-10-20T15:34:50Z
dc.date.issued2012-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21437
dc.sourceIIOimport
dc.titleIntegrated spectrometer and integrated detectors on silicon-on-insulator for short-wave infrared applications
dc.typeProceedings paper
dc.contributor.imecauthorRyckeboer, Eva
dc.contributor.imecauthorKuyken, Bart
dc.contributor.imecauthorRoelkens, Gunther
dc.contributor.imecauthorBogaerts, Wim
dc.contributor.imecauthorBaets, Roel
dc.contributor.orcidimecRyckeboer, Eva::0000-0001-8648-3258
dc.contributor.orcidimecRoelkens, Gunther::0000-0002-4667-5092
dc.contributor.orcidimecBogaerts, Wim::0000-0003-1112-8950
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageCTu1A.3
dc.source.conferenceConferene on Lasers and Electro-Optics - CLEO
dc.source.conferencedate6/05/2012
dc.source.conferencelocationSan Jose, CA USA
imec.availabilityPublished - open access


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