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Extraction of accurate lifetime and doping profiles in Si p-n junction diodes
Publication:
Extraction of accurate lifetime and doping profiles in Si p-n junction diodes
Date
1997
Meeting abstract
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2119.pdf
64.28 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
;
Czerwinski, A.
;
Tomaszewski, D.
;
Gibki, J.
;
Bakowski, A.
;
Katcki, J.
Journal
Abstract
Description
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Views
2012
since deposited on 2021-09-30
442
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
2012
since deposited on 2021-09-30
442
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations