dc.contributor.author | Sankaran, Kiroubanand | |
dc.contributor.author | Goux, Ludovic | |
dc.contributor.author | Clima, Sergiu | |
dc.contributor.author | Mees, Maarten | |
dc.contributor.author | Kittl, Jorge | |
dc.contributor.author | Jurczak, Gosia | |
dc.contributor.author | Altimime, Laith | |
dc.contributor.author | Rignanese, Gian-Marco | |
dc.contributor.author | Pourtois, Geoffrey | |
dc.date.accessioned | 2021-10-20T15:42:51Z | |
dc.date.available | 2021-10-20T15:42:51Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21455 | |
dc.source | IIOimport | |
dc.title | Modeling of copper diffusion in amorphous aluminum oxide in CBRAM memory stack | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Sankaran, Kiroubanand | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.imecauthor | Clima, Sergiu | |
dc.contributor.imecauthor | Mees, Maarten | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.orcidimec | Sankaran, Kiroubanand::0000-0001-6988-7269 | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.contributor.orcidimec | Clima, Sergiu::0000-0002-4044-9975 | |
dc.contributor.orcidimec | Mees, Maarten::0000-0001-7217-5510 | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 317 | |
dc.source.endpage | 330 | |
dc.source.conference | Dielectrics for Nanosystems 5: Materials Science, Processing, Reliability, and Manufacturing -and- Tutorials in Nanotechnology | |
dc.source.conferencedate | 6/05/2012 | |
dc.source.conferencelocation | Seattle, WA USA | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Transactions; Vol. 45, Iss. 3 | |