Dynamic monitoring of DNA denaturation using the capacitive properties of diamond electrodes
dc.contributor.author | Schneider, B. | |
dc.contributor.author | Bäcker, M. | |
dc.contributor.author | van Grinsven, B. | |
dc.contributor.author | Murib, M. | |
dc.contributor.author | Janssens, S.D. | |
dc.contributor.author | Haenen, Ken | |
dc.contributor.author | Poghossian, A. | |
dc.contributor.author | Schöning, M.J. | |
dc.contributor.author | Wagner, Patrick | |
dc.date.accessioned | 2021-10-20T15:49:02Z | |
dc.date.available | 2021-10-20T15:49:02Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21469 | |
dc.source | IIOimport | |
dc.title | Dynamic monitoring of DNA denaturation using the capacitive properties of diamond electrodes | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Haenen, Ken | |
dc.contributor.orcidimec | Haenen, Ken::0000-0001-6711-7367 | |
dc.source.peerreview | no | |
dc.source.conference | Hasselt Diamond Workshop - SBDD XVII | |
dc.source.conferencedate | 14/03/2012 | |
dc.source.conferencelocation | Hasselt Belgium | |
imec.availability | Published - imec |
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