dc.contributor.author | Scholz, Mirko | |
dc.contributor.author | Chen, Shih-Hung | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Johnsson, David | |
dc.contributor.author | Gallerano, Antonio | |
dc.contributor.author | Lafonteese, David | |
dc.contributor.author | Concannon, Ann | |
dc.contributor.author | Vandersteen, Gerd | |
dc.contributor.author | Sawada, Masanori | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-20T15:50:21Z | |
dc.date.available | 2021-10-20T15:50:21Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21472 | |
dc.source | IIOimport | |
dc.title | Miscorrelation between IEC61000-4-2 type of HMM tester and 50 $X HMM tester | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Chen, Shih-Hung | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Vandersteen, Gerd | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.source.peerreview | yes | |
dc.source.conference | EOS/ESD Symposium | |
dc.source.conferencedate | 9/09/2012 | |
dc.source.conferencelocation | Tucson, AZ USA | |
imec.availability | Published - imec | |