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dc.contributor.authorScholz, Mirko
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorLinten, Dimitri
dc.contributor.authorJohnsson, David
dc.contributor.authorGallerano, Antonio
dc.contributor.authorLafonteese, David
dc.contributor.authorConcannon, Ann
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorSawada, Masanori
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-20T15:50:21Z
dc.date.available2021-10-20T15:50:21Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21472
dc.sourceIIOimport
dc.titleMiscorrelation between IEC61000-4-2 type of HMM tester and 50 $X HMM tester
dc.typeProceedings paper
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorVandersteen, Gerd
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.conferenceEOS/ESD Symposium
dc.source.conferencedate9/09/2012
dc.source.conferencelocationTucson, AZ USA
imec.availabilityPublished - imec


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