Standard cell level parasitics assessment in 20nm BPL and 14nm BFF

Thumbnail
View/open
Metadata
Show full item record
Authors
Schuddinck, Pieter; Badaroglu, Mustafa; Stucchi, Michele; Demuynck, Steven; Hikavyy, Andriy; Garcia Bardon, Marie; Mercha, Abdelkarim; Mallik, Arindam; Chiarella, Thomas; Kubicek, Stefan; Athimulam, Raja; Collaert, Nadine; Horiguchi, Naoto; Debusschere, Ingrid; Thean, Aaron; Altimime, Laith; Verkest, Diederik
Conference
International Electron Devices Meeting - IEDM
Title
Standard cell level parasitics assessment in 20nm BPL and 14nm BFF
Publication type
Proceedings paper
Embargo date
9999-12-31
Collections