dc.contributor.author | Schulze, Andreas | |
dc.contributor.author | Hantschel, Thomas | |
dc.contributor.author | Eyben, Pierre | |
dc.contributor.author | Verhulst, Anne | |
dc.contributor.author | Rooyackers, Rita | |
dc.contributor.author | Vandooren, Anne | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-20T15:55:41Z | |
dc.date.available | 2021-10-20T15:55:41Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21483 | |
dc.source | IIOimport | |
dc.title | Extending scanning spreading resistance microscopy towards three-dimensional quantitative carrier mapping in nanowire-based transistors | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Hantschel, Thomas | |
dc.contributor.imecauthor | Eyben, Pierre | |
dc.contributor.imecauthor | Verhulst, Anne | |
dc.contributor.imecauthor | Vandooren, Anne | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Hantschel, Thomas::0000-0001-9476-4084 | |
dc.contributor.orcidimec | Verhulst, Anne::0000-0002-3742-9017 | |
dc.contributor.orcidimec | Vandooren, Anne::0000-0002-2412-0176 | |
dc.source.peerreview | no | |
dc.source.conference | E-MRS Fall Meeting Symp. J: High-Resolution Electrical and Chemical Characteriz. of Nanometer-Scale Organic and Inorg. Devices | |
dc.source.conferencedate | 17/09/2012 | |
dc.source.conferencelocation | Warsaw Poland | |
imec.availability | Published - imec | |