dc.contributor.author | Selvaraja, Shankar | |
dc.contributor.author | Fernandez, Luis | |
dc.contributor.author | Vanslembrouck, Michael | |
dc.contributor.author | Everaert, Jean-Luc | |
dc.contributor.author | Dumon, Pieter | |
dc.contributor.author | Van Campenhout, Joris | |
dc.contributor.author | Bogaerts, Wim | |
dc.contributor.author | Absil, Philippe | |
dc.date.accessioned | 2021-10-20T15:57:02Z | |
dc.date.available | 2021-10-20T15:57:02Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21486 | |
dc.source | IIOimport | |
dc.title | Si photonic device uniformity improvement using wafer-scale location specific processing | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vanslembrouck, Michael | |
dc.contributor.imecauthor | Everaert, Jean-Luc | |
dc.contributor.imecauthor | Van Campenhout, Joris | |
dc.contributor.imecauthor | Bogaerts, Wim | |
dc.contributor.imecauthor | Absil, Philippe | |
dc.contributor.orcidimec | Van Campenhout, Joris::0000-0003-0778-2669 | |
dc.contributor.orcidimec | Bogaerts, Wim::0000-0003-1112-8950 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 725 | |
dc.source.endpage | 726 | |
dc.source.conference | IEEE Photonics Conference | |
dc.source.conferencedate | 23/09/2012 | |
dc.source.conferencelocation | Burlingame, CA USA | |
imec.availability | Published - open access | |