Show simple item record

On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs

dc.contributor.authorSimoen, Eddy
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorVeloso, Anabela
dc.contributor.authorJurczak, Gosia
dc.contributor.authorClaeys, Cor
dc.contributor.authorMendes Almeida, Luciano
dc.contributor.authorAndrada, Gloria
dc.contributor.authorLuque Rodrigues, Abraham
dc.contributor.authorJimenez Tejada, Juan Antonio
dc.contributor.authorCaillat, Christian
dc.contributor.authorFazan, Pierre
dc.date.accessioned2021-10-20T16:08:45Z
dc.date.available2021-10-20T16:08:45Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21511
dc.sourceIIOimport
dc.titleOn the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorFazan, Pierre
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage338
dc.source.endpage341
dc.source.conference42nd European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate17/09/2012
dc.source.conferencelocationBordeaux France
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
24973.pdf
Size:
1013.Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record