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Insights in low frequency noise of advanced and high-mobility channel transistors

dc.contributor.authorSimoen, Eddy
dc.contributor.authorRomeo, Tomasso
dc.contributor.authorLuque Rodriguez, Abraham
dc.contributor.authorJimenez Tejada, Juan Antonio
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorVeloso, Anabela
dc.contributor.authorJurczak, Gosia
dc.contributor.authorMitard, Jerome
dc.contributor.authorCaillat, Christian
dc.contributor.authorFazan, Pierre
dc.contributor.authorCrupi, Felice
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-20T16:11:15Z
dc.date.available2021-10-20T16:11:15Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21516
dc.sourceIIOimport
dc.titleInsights in low frequency noise of advanced and high-mobility channel transistors
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorFazan, Pierre
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage28.7
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate10/12/2012
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access


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