Study of time-dependent degradation of reverse biased AlGaN/GaN HEMTs

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Authors
Stocco, Antonio; Meneghini, Matteo; Bertin,; Marcon, Denis; Meneghesso, Gaudenzio; Zanoni, Enrico
Conference
Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE
Title
Study of time-dependent degradation of reverse biased AlGaN/GaN HEMTs
Publication type
Meeting abstract
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