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III-V/oxide interfaces investigated with synchrotron radiation photoemission spectroscopy

dc.contributor.authorTallarida, Massimo
dc.contributor.authorAdelmann, Christoph
dc.contributor.authorDelabie, Annelies
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorCaymax, Matty
dc.contributor.authorDieter, Schmeisser
dc.date.accessioned2021-10-20T16:43:08Z
dc.date.available2021-10-20T16:43:08Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21583
dc.sourceIIOimport
dc.titleIII-V/oxide interfaces investigated with synchrotron radiation photoemission spectroscopy
dc.typeProceedings paper
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.imecauthorDelabie, Annelies
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.source.peerreviewyes
dc.source.beginpage123
dc.source.endpage128
dc.source.conferenceDielectric Materials and Metals for Nanoelectronics and Photonics 10
dc.source.conferencedate7/10/2012
dc.source.conferencelocationHonolulu, HI USA
dc.identifier.urlhttp://ecst.ecsdl.org/content/50/4/123.abstract?sid=ae6626b4-0c76-404e-8927-e76443887628
imec.availabilityPublished - imec
imec.internalnotesECS Transactions; Vol. 50, Issue 4


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