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dc.contributor.authorThijs, Steven
dc.date.accessioned2021-10-20T16:54:13Z
dc.date.available2021-10-20T16:54:13Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21606
dc.sourceIIOimport
dc.titleESD protection in FinFET technologies
dc.typeProceedings paper
dc.contributor.imecauthorThijs, Steven
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage53
dc.source.endpage72
dc.source.conferenceInternational ESD Workshop - IEW
dc.source.conferencedate14/05/2012
dc.source.conferencelocationOud-Turnhout Belgium
imec.availabilityPublished - open access
imec.internalnotesSeminar #3


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