ESD protection in FinFET technologies
dc.contributor.author | Thijs, Steven | |
dc.date.accessioned | 2021-10-20T16:54:13Z | |
dc.date.available | 2021-10-20T16:54:13Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21606 | |
dc.source | IIOimport | |
dc.title | ESD protection in FinFET technologies | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Thijs, Steven | |
dc.contributor.orcidimec | Thijs, Steven::0000-0003-2889-8345 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 53 | |
dc.source.endpage | 72 | |
dc.source.conference | International ESD Workshop - IEW | |
dc.source.conferencedate | 14/05/2012 | |
dc.source.conferencelocation | Oud-Turnhout Belgium | |
imec.availability | Published - open access | |
imec.internalnotes | Seminar #3 |