Authors

Toledano Luque, Maria; Degraeve, Robin; Kaczer, Ben; Tang, B.; Roussel, Philippe; Weckx, Pieter; Franco, Jacopo; Arreghini, Antonio; Suhane, Amit; Kar, Gouri Sankar; Van den Bosch, Geert; Groeseneken, Guido; Van Houdt, Jan

Conference

International Electron Devices Meeting - IEDM

Title

Quantitative and predictive model of reading current variability in deeply scaled vertical poly-Si channel for 3D memories

Publication type

Proceedings paper

Embargo date

9999-12-31