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Automatic software for statistical prediction of reading current variability in deeply scaled 3D poly-Si channel SONOS memories

dc.contributor.authorToledano Luque, Maria
dc.contributor.authorDegraeve, Robin
dc.contributor.authorRoussel, Philippe
dc.date.accessioned2021-10-20T16:59:44Z
dc.date.available2021-10-20T16:59:44Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21617
dc.sourceIIOimport
dc.titleAutomatic software for statistical prediction of reading current variability in deeply scaled 3D poly-Si channel SONOS memories
dc.typeMeeting abstract
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceThe 8th International Nanotechnology Conference on Communication and Cooperation
dc.source.conferencedate8/05/2012
dc.source.conferencelocationTsukuba Japan
imec.availabilityPublished - open access


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