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Defect-centric perspective of time-dependent BTI variability

dc.contributor.authorToledano Luque, Maria
dc.contributor.authorKaczer, Ben
dc.contributor.authorFranco, Jacopo
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGrasser, Tibor
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-20T17:00:18Z
dc.date.available2021-10-20T17:00:18Z
dc.date.issued2012
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21618
dc.sourceIIOimport
dc.titleDefect-centric perspective of time-dependent BTI variability
dc.typeJournal article
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1883
dc.source.endpage1980
dc.source.journalMicroelectronics Reliability
dc.source.issue9_10
dc.source.volume52
imec.availabilityPublished - open access
imec.internalnotesESREF 2012


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