Defect-centric perspective of time-dependent BTI variability

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Authors
Toledano Luque, Maria; Kaczer, Ben; Franco, Jacopo; Roussel, Philippe; Grasser, Tibor; Groeseneken, Guido
ISSN
0026-2714
Issue
9_10
Journal
Microelectronics Reliability
Volume
52
Title
Defect-centric perspective of time-dependent BTI variability
Publication type
Journal article
Embargo date
9999-12-31
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