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Articles
Defect-centric perspective of time-dependent BTI variability
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Defect-centric perspective of time-dependent BTI variability
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Toledano Luque, Maria
;
Kaczer, Ben
;
Franco, Jacopo
;
Roussel, Philippe
;
Grasser, Tibor
;
Groeseneken, Guido
Journal
Microelectronics Reliability
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1805
since deposited on 2021-10-20
Acq. date: 2025-12-15
Citations
Metrics
Views
1805
since deposited on 2021-10-20
Acq. date: 2025-12-15
Citations