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dc.contributor.authorVan Nieuwenhuysen, Kris
dc.contributor.authorGordon, Ivan
dc.contributor.authorBearda, Twan
dc.contributor.authorBoulord, Caroline
dc.contributor.authorDebucquoy, Maarten
dc.contributor.authorDepauw, Valerie
dc.contributor.authorDross, Frederic
dc.contributor.authorGovaerts, Jonathan
dc.contributor.authorGranata, Stefano
dc.contributor.authorLabie, Riet
dc.contributor.authorLoozen, Xavier
dc.contributor.authorMartini, Roberto
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorSivaramakrishnan Radhakrishnan, Hariharsudan
dc.contributor.authorBaert, Kris
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-20T17:49:37Z
dc.date.available2021-10-20T17:49:37Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21716
dc.sourceIIOimport
dc.titleHigh-quality epitaxial foils, obtained by a layer transfer process, for integration in back-contacted solar cells processed on glass
dc.typeProceedings paper
dc.contributor.imecauthorGordon, Ivan
dc.contributor.imecauthorDebucquoy, Maarten
dc.contributor.imecauthorDepauw, Valerie
dc.contributor.imecauthorGovaerts, Jonathan
dc.contributor.imecauthorLabie, Riet
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorSivaramakrishnan Radhakrishnan, Hariharsudan
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecGordon, Ivan::0000-0002-0713-8403
dc.contributor.orcidimecDebucquoy, Maarten::0000-0001-5980-188X
dc.contributor.orcidimecDepauw, Valerie::0000-0003-2045-9698
dc.contributor.orcidimecGovaerts, Jonathan::0000-0002-8908-1198
dc.contributor.orcidimecLabie, Riet::0000-0002-1401-1291
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecSivaramakrishnan Radhakrishnan, Hariharsudan::0000-0003-1963-273X
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1833
dc.source.endpage1836
dc.source.conference38th IEEE Photovoltaic Specialists Conference - PVSC
dc.source.conferencedate3/06/2012
dc.source.conferencelocationAustin, TX USA
imec.availabilityPublished - open access


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