Show simple item record

Probing 3D-semiconductors structures

dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-20T18:01:09Z
dc.date.available2021-10-20T18:01:09Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21739
dc.sourceIIOimport
dc.titleProbing 3D-semiconductors structures
dc.typeOral presentation
dc.contributor.imecauthorVandervorst, Wilfried
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceUK-Surface Analysis
dc.source.conferencedate7/01/2012
dc.source.conferencelocationOxford UK
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
26626.pdf
Size:
74.91Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record