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dc.contributor.authorTian, Chunsheng
dc.contributor.authorElst, Kathy
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorMaex, Karen
dc.date.accessioned2021-09-30T09:39:47Z
dc.date.available2021-09-30T09:39:47Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2181
dc.sourceIIOimport
dc.titlePositive ion yields under variable oxidation levels
dc.typeProceedings paper
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorMaex, Karen
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage203
dc.source.endpage206
dc.source.conferenceSecondary Ion Mass Spectrometry - SIMS X : Proceedings of the 10th International Conference
dc.source.conferencedate2/10/1995
dc.source.conferencelocationMünster Germany
imec.availabilityPublished - imec


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