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Probing near-field hot spots by localized surface enhanced Raman scattering

dc.contributor.authorYe, Jian
dc.contributor.authorChen, Chang
dc.contributor.authorWen, Fangfang
dc.contributor.authorSobhani, Heidar
dc.contributor.authorNordlander, Peter
dc.contributor.authorHalas, Naomi
dc.contributor.authorVan Dorpe, Pol
dc.date.accessioned2021-10-20T19:14:06Z
dc.date.available2021-10-20T19:14:06Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21879
dc.sourceIIOimport
dc.titleProbing near-field hot spots by localized surface enhanced Raman scattering
dc.typeProceedings paper
dc.contributor.imecauthorVan Dorpe, Pol
dc.contributor.orcidimecVan Dorpe, Pol::0000-0003-0918-1664
dc.source.peerreviewyes
dc.source.conferenceThe 6th International Conference on Nanophotonics - ICNP
dc.source.conferencedate27/05/2012
dc.source.conferencelocationBeijing China
imec.availabilityPublished - imec


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